Title :
Silicon nanowire based radio-frequency spectrum analyser
Author :
Corcoran, B. ; Vo, T.D. ; Pelusi, M. ; Monat, C. ; Xu, D.X. ; Densmore, A. ; Ma, R. ; Janz, S. ; Moss, D.J. ; Eggleton, B.J.
Author_Institution :
Inst. for Photonics &, Opt. Sci. (IPOS), Univ. of Sydney, Sydney, NSW, Australia
Abstract :
We demonstrate a silicon nanowire based radio-frequency spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.
Keywords :
amplitude shift keying; elemental semiconductors; high-speed optical techniques; nanophotonics; nanowires; optical communication equipment; optical dispersion; optical losses; silicon; spectral analysers; Si; bit rate 640 Gbit/s; free-carrier dispersion; nonlinear loss; on-off-keying; radiofrequency spectrum analyser; silicon nanowire; ultrahigh speed optical data; High speed optical techniques; Modulation; Nonlinear optics; Optical pulses; Optical waveguides; Probes; Radio frequency;
Conference_Titel :
Group IV Photonics (GFP), 2010 7th IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-6344-2
DOI :
10.1109/GROUP4.2010.5643325
