DocumentCode
3202458
Title
Principles of a broad based environment for test (ABBET) demonstration (PAD): "ABBET in action"
Author
Weiss, Daniel H.
Author_Institution
Lawrence Associates Inc., Springfield, VA, USA
fYear
1995
fDate
8-10 Aug. 1995
Firstpage
69
Lastpage
74
Abstract
ABBET (A Broad Based Environment for Test) is planned to be free of any dependencies-hardware and/or software. This implementation independent concept while desirable appeared difficult to achieve until an investigation of the potential of Object Technology was conducted. The use of Object Technology seemed to address test program cost issues in the commercial sector where savings of 20-40% and similar and/or greater reductions in test program cycle time were experienced. To determine if ABBET was an approach that would withstand the rigors of production implementation in a "Real World" setting, a demonstration was planned. Because the ABBET standards adaptation of Object Technology was not complete and because there were no ABBET compliant test program development tools in the marketplace, the evolving standard was reviewed and a subset of the principles that underlie ABBET were identified to be exercised. If was believed that if these principles could be followed successfully in a pilot program, the feasibility of applying an Object Technology based standard to achieve implementation independence that, in turn, would lower the cost of test could be proven. Based on this premise, the Principles of ABBET Demonstration (PAD) was conducted. This paper provides a background that discusses, in some detail, the reasons for creating ABBET and the circumstances that led to PAD. The preliminary PAD results are described and projections made as to the outcome of PAD and how ABBET should mature in the future to benefit from the PAD experience.
Keywords
IEEE standards; automatic test equipment; production testing; ABBET; ABBET standards; PAD; broad based test environment; implementation independent concept; object technology; production implementation; test program cost issues; test program cycle time; Atherosclerosis; Consumer electronics; Costs; Electronic components; Electronic equipment testing; Hardware; Production; Software testing; Standards development; Technology transfer;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-2621-0
Type
conf
DOI
10.1109/AUTEST.1995.522655
Filename
522655
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