DocumentCode
3202508
Title
Issues involved in reuse library for design for test
Author
Carmichael, L. ; Damarla, T. ; Chug, M.J. ; Chung, M.J.
Author_Institution
Phys. Sci. Directorate, US Army Res. Lab., Ft. Monmouth, NJ, USA
fYear
1995
fDate
8-10 Aug. 1995
Firstpage
84
Lastpage
93
Abstract
Test has historically represented a significant amount of the cost associated with systems. Advancements in design automation and the application of concurrent engineering has allowed test to be considered when designing systems. The early inclusion of test into the design cycle and the reuse of design incorporating test information reduces the total time and cost associated with system development. This paper reports on the implementation of a design-for-test reuse data model and highlights the issues involved in creating a design-for-test reuse library (i.e. what test information should be included; allocation of test resources; etc.). Additionally, an example of the design-for-test reuse data model is presented.
Keywords
automatic testing; concurrent engineering; design for testability; resource allocation; concurrent engineering; design automation; design cycle; design for test; reuse data model; reuse library; system development; test information; test resource allocation; Built-in self-test; Circuit testing; Controllability; Design for testability; Latches; Libraries; Linear feedback control systems; Logic; Observability; Shift registers;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-2621-0
Type
conf
DOI
10.1109/AUTEST.1995.522658
Filename
522658
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