IC schematic vulnerability to the temperature field distribution: Pre-layout estimation

The approach for pre-layout estimation of the influence of non-uniformly distributed temperature field on ICs functioning has been presented in this paper. The technique for automatic synthesis of the models of ICs schematic vulnerability to local temperatures on the basis of the theory of computer experiment design is used here. Such models reflect the dependence of the temperature drift of circuit response on local temperatures of circuit elements. The qualitative and quantitative estimation of circuit vulnerability to temperature field distribution has been performed on the basis of the synthesised models.