High frequency E-field probe

Author

Harasztosi, Zsolt

Author_Institution

Dept. of Electron. & Technol., Budapest Univ. of Technol. & Econ., Hungary

fYear

2001

fDate

2001

Firstpage

172

Lastpage

174

Abstract

This paper describes the construction of a high frequency E-field probe produced using polymer thick film technology. The probe is the key element of a complex measurement system which examines the absorbed power caused by the electromagnetic field of cellular phone equipment. The measurement system meets the requirements of the CENELEC recommendations in this area. The probe measures magnitude of the high frequency E-field (in the range of GSM characteristic frequencies, 900/1800 MHz), converts it into a DC voltage, and transmits this voltage towards the next element of the measurement system. This paper shows the planning details of the probe, focusing on the fixing of electric parameters

Keywords

cellular radio; electric field measurement; polymer films; probes; telecommunication equipment testing; telephone sets; test equipment; thick film devices; CENELEC recommendations; DC voltage; GSM characteristic frequencies; absorbed power; cellular phone equipment; electric parameters; electromagnetic field; high frequency E-field magnitude; high frequency E-field probe; measurement system; polymer thick film technology; Cellular phones; Electromagnetic fields; Electromagnetic measurements; Frequency conversion; Frequency measurement; Polymer films; Power measurement; Probes; Thick films; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Technology: Concurrent Engineering in Electronic Packaging, 2001. 24th International Spring Seminar on

Conference_Location

Calimanesti-Caciulata

Print_ISBN

0-7803-7111-9

Type

conf

DOI

10.1109/ISSE.2001.931044

Filename

931044