DocumentCode
3202877
Title
Analysis of the ultra-fast switching dynamics in a hybrid MOSFET/Driver
Author
Tang, T. ; Burkhart, C.
Author_Institution
SLAC Nat. Accel. Lab., Menlo Park, CA, USA
fYear
2009
fDate
June 28 2009-July 2 2009
Firstpage
276
Lastpage
279
Abstract
The turn-on dynamics of a power MOSFET during ultra-fast, ~ns, switching are discussed in this paper. The testing was performed using a custom hybrid MOSFET/driver module, which was fabricated by directly assembling die-form components, power MOSFET and drivers, on a printed circuit board. By using die-form components, the hybrid approach substantially reduces parasitic inductance, which facilitates ultra-fast switching. The measured turn on time of the hybrid module with a resistive load is 1.2 ns with an applied voltage of 1000 V and drain current of 33 A. Detailed analysis of the switching waveforms reveals that switching behavior must be interpreted differently in the ultra-fast regime. For example, the gate threshold voltage to turn on the device is observed to increase as the switching time decreases. Further analysis and simulation of MOSFET switching behavior shows that the minimum turn on time scales with the product of the drain-source on resistance and drain-source capacitance, RDS(on)COSS. This information will be useful in power MOSFET selection and gate driver design for ultra-fast switching applications.
Keywords
MOSFET; driver circuits; printed circuits; switching; MOSFET switching behavior simulation; current 33 A; drain-source capacitance; gate driver design; gate threshold voltage; hybrid MOSFET-driver module; metal-oxide-semiconductor field effect transistors; parasitic inductance; printed circuit board; time 1.2 ns; ultra-fast switching dynamic analysis; voltage 1000 V; Assembly; Circuit testing; Current measurement; Driver circuits; Inductance; MOSFET circuits; Performance evaluation; Power MOSFET; Printed circuits; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2009. PPC '09. IEEE
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-4064-1
Electronic_ISBN
978-1-4244-4065-8
Type
conf
DOI
10.1109/PPC.2009.5386249
Filename
5386249
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