DocumentCode
3203072
Title
Hygro-thermal buckling of a thin PBGA package
Author
Chien, Chi-Hui ; Chen, Thaiping ; Chiou, Yii-Tay ; Hsieh, Chi-Chang ; Wu, Yii-Der ; Wang, Chung-Ting
Author_Institution
Dept. of Mech. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Volume
2
fYear
2004
fDate
16-19 May 2004
Firstpage
637
Abstract
In this present paper, the stability equations foe the PBGA package´s warpage without the solder balls subjected to hygro-thermal loading, by modeled as an initial perfect composite plate, have been developed. The analytical closed-form solutions are found and used to compute not only the critical moisture contents but also the warpage before reaching the critical loads. The buckling of the PBGA packages, at the solder reflow peak temperature, occurs, when the theoretical moisture contents reach 0.259-0.283%w. These theoretically critical moisture contents accurately predict the experimental critical moisture contents 0.25-0.30%w from our previous work. However, the buckling occurs theoretically in the initial perfect package´s structures at room temperature, but not occur practically. The structures of the PBGA package before buckling become stress-free at the moisture content 0.077%w and at the room temperature during moisture conditioning.
Keywords
ball grid arrays; buckling; humidity; plastic packaging; reflow soldering; thermal stability; analytical closed-form solutions; buckling; critical loads; critical moisture contents; hygro-thermal buckling; initial perfect composite plate; solder reflow peak temperature; stability equations; thin PBGA package; warpage; Channel hot electron injection; Closed-form solution; Electronic packaging thermal management; Electronics packaging; Equations; Laminates; Moisture; Semiconductor device modeling; Stability; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2004. 24th International Conference on
Print_ISBN
0-7803-8166-1
Type
conf
DOI
10.1109/ICMEL.2004.1314909
Filename
1314909
Link To Document