DocumentCode
3203245
Title
Modeling and analysis of accelerated life test data
Author
Andonova, Anna
Author_Institution
Dept. of Microelectron., Tech. Univ. of Sofia, Bulgaria
fYear
2001
fDate
2001
Firstpage
306
Lastpage
309
Abstract
An algorithm has been developed to implement accelerated life test data analysis for multiple type stress. The advantage is that it combines in one model most of the known life-stress relationships for one or two types of stresses such as the temperature-nonthermal modes. The solution to this model provides the engineers with an opportunity to expand their selection types, stresses and test conditions when the products are tested
Keywords
data analysis; electronic equipment testing; life testing; thermal stresses; accelerated life test data; accelerated life test data analysis algorithm; life-stress relationships; modeling; multiple type stress; temperature-nonthermal stress modes; test conditions; test stresses; Acceleration; Data analysis; Life estimation; Life testing; Microelectronics; Performance analysis; Performance evaluation; Statistical analysis; Temperature; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology: Concurrent Engineering in Electronic Packaging, 2001. 24th International Spring Seminar on
Conference_Location
Calimanesti-Caciulata
Print_ISBN
0-7803-7111-9
Type
conf
DOI
10.1109/ISSE.2001.931089
Filename
931089
Link To Document