DocumentCode :
3203602
Title :
Transients in electric circuits of capacitor cells and workability of semiconductor switches
Author :
Enikeev, R.Sh. ; Fridman, B.E.
Author_Institution :
D.V. Efremov Sci. Res. Inst. of Electrophys. Apparatus, St. Petersburg, Russia
fYear :
2009
fDate :
June 28 2009-July 2 2009
Firstpage :
382
Lastpage :
388
Abstract :
The paper presents the results of the study of capacitor cells of capacitive energy storage with a semiconductor switch composed of reverse-switched dynistors (RSD) and power diodes. The authors investigate operation of the switches in the programmable discharge mode and operation into the load of an exploding wire type. It is shown that possible is the occurrence of the reverse voltage on the RSD anodes before their initiation, as well as current pauses in RSD followed by re-discharge of the capacitor through RSD. The prerequisites to the occurrence of switching overvoltages dangerous to the semiconductor structures workability are investigated. Damping of switching overvoltages by snubber circuits and varistors is studied. Operation of diodes with fast and soft recovery in the surge currents and programmable discharge mode is investigated. It is proposed to use soft recovery diodes to reduce the switching overvoltage amplitude. The thermal generation peak of forward voltage drop was registered on soft recovery diodes to control the heating and the allowable level of current on the semiconductor structures.
Keywords :
energy storage; semiconductor switches; capacitive energy storage; capacitor cells; electric circuits; power diodes; programmable discharge mode; reverse-switched dynistors; semiconductor structures; semiconductor switches; soft recovery diodes; surge currents; Anodes; Energy storage; Power semiconductor switches; Semiconductor diodes; Surges; Switched capacitor circuits; Switching circuits; Voltage; Wire; Workability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 2009. PPC '09. IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-4064-1
Electronic_ISBN :
978-1-4244-4065-8
Type :
conf
DOI :
10.1109/PPC.2009.5386285
Filename :
5386285
Link To Document :
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