DocumentCode
3203658
Title
Evaluation of conductor stresses in a pulsed high-current toroidal transformer
Author
Turchi, P.J. ; Reass, W.A. ; Rousculp, C.L. ; Oro, D.M. ; Merrill, F.E. ; Griego, J.R. ; Reinovsky, R.E.
Author_Institution
Los Alamos Nat. Lab., Los Alamos, NM, USA
fYear
2009
fDate
June 28 2009-July 2 2009
Firstpage
372
Lastpage
377
Abstract
The Precision, High-Energy Density, Liner Implosion eXperiment (PHELIX) pulsed power driver is currently under development at Los Alamos National Laboratory. When operational PHELIX will provide 5-10 MAmps of peak current with pulse rise-time of ~5-10 ms. Crucial to the performance of PHELIX is a multi-turn primary, single-turn secondary, current step-up toroidal transformer, Rmajor ~ 30 cm, Rminor ~ 10 cm. The transformer lifetime should exceed 100 shots. Therefore it is essential that the design be robust enough to survive the magnetic stresses produced by high currents. In order to evaluate our design, two methods have been utilized. First, an analytical evaluation has been performed. By identifying the magnetic forces as J1 2/2 ¿L1 + J1J2¿M12, where J1 and J2 are currents in two circuits, coupled by mutual inductance M12 and L1 is the self-inductance of the circuit carrying current J1, analytical estimates of stress can be obtained. These results are then compared to a computational MHD model of the same system and to a full finite-element, electromagnetic simulation.
Keywords
finite element analysis; pulsed power supplies; transformers; Los Alamos National Laboratory; PHELIX; conductor stresses evaluation; current 5 MA to 10 MA; electromagnetic simulation; finite-element; magnetic stresses; pulsed high-current toroidal transformer; pulsed power driver; time 5 ms to 10 ms; Computational modeling; Conductors; Design methodology; Laboratories; Magnetic analysis; Magnetic circuits; Pulse transformers; Robustness; Stress; Toroidal magnetic fields;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2009. PPC '09. IEEE
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-4064-1
Electronic_ISBN
978-1-4244-4065-8
Type
conf
DOI
10.1109/PPC.2009.5386287
Filename
5386287
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