DocumentCode :
3203676
Title :
Optical properties of ErxYb2−xSi2O7 thin film grown by RF magnetron sputtering method
Author :
Zheng, Jun ; Tao, Yeliao ; Wang, Wei ; Chen, Yu ; Ma, Zhihua ; Xue, Chunlai ; Zuo, Yuhua ; Cheng, Buwen ; Wang, Qiming
Author_Institution :
State Key Lab. on Integrated Optoelectron., Chinese Acad. of Sci., Beijing, China
fYear :
2010
fDate :
1-3 Sept. 2010
Firstpage :
156
Lastpage :
158
Abstract :
ErxYb2-xSi2O7 thin films are synthesized on thermally oxidized n-Si substrates by RF-magnetron co-sputtering and subsequent annealing process. The photoluminescence properties of ErxYb2-xSi2O7 thin films with 488 nm and 974 nm pumping lasers have been investigated.
Keywords :
annealing; erbium compounds; photoluminescence; sputter deposition; thin films; ytterbium compounds; ErxYb2-xSi2O7; RF magnetron sputtering; annealing; optical properties; photoluminescence; pumping lasers; thermal oxidation; thin films; Annealing; Erbium; Films; Ions; Laser excitation; Pump lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Group IV Photonics (GFP), 2010 7th IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-6344-2
Type :
conf
DOI :
10.1109/GROUP4.2010.5643394
Filename :
5643394
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3203676
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