• DocumentCode
    3203757
  • Title

    Non-destructive variability tolerant differential read for non-volatile logic

  • Author

    Das, Jayita ; Alam, Syed M. ; Bhanja, Sanjukta

  • Author_Institution
    Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    2012
  • fDate
    5-8 Aug. 2012
  • Firstpage
    178
  • Lastpage
    181
  • Abstract
    In Magnetoresistive RAMs (MRAMs), Magnetic Tunnel Junctions (MTJs) are used to store bits in memory and the bits are read by comparing the MTJ resistance to a reference value. But in non-volatile logic, MTJs are used to store as well as compute by coupling with one another. This results in a `1´ and `0´ lying side by side in logic. Motivated by this inherent property of logic, in this paper we have first developed a differential read for the logic where we have compared a bit with its complement. A differential read provides higher sense margin than any reference reading and eliminates the requirement of reference resistance. Under current technology, the variations in MTJ are sufficient to degrade the sense margin of the circuit to a point when error-free reading becomes a challenge. To make the read more robust, in this paper we have further modified the differential read to design a novel variability tolerant read. Apart from being more immune to MTJ variations, the circuit provides better sense margin than differential read. In this work we have also investigated the factors that influence the sense margin in variability tolerant differential read circuit. Some interesting results from our study include the increased sensitivity of the sense margin to MTJ state `0´ resistance than state `1´ resistance and improvement in variability tolerance with increased Tunnel Magnetoresistance (TMR) of MTJ. The study also includes supportive simulation results.
  • Keywords
    MRAM devices; logic circuits; random-access storage; MRAM; MTJ resistance; TMR; error-free reading; magnetic tunnel junctions; magnetoresistive RAM; nondestructive variability tolerant differential read; nonvolatile logic; reference resistance; sense margin; tunnel magnetoresistance; CMOS integrated circuits; Couplings; Magnetic tunneling; Nonvolatile memory; Resistance; Transistors; Tunneling magnetoresistance; MTJ; differential read; non-destructive; non-volatile logic; variability tolerant;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
  • Conference_Location
    Boise, ID
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4673-2526-4
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2012.6291986
  • Filename
    6291986