Title :
Sanyo´s Challenges to the Development of High-efficiency HIT Solar Cells and the Expansion of HIT Business
Author :
Maruyama, Eiji ; Terakawa, Akira ; Taguchi, Mikio ; Yoshimine, Yukihiro ; Ide, Daisuke ; Baba, Toshiaki ; Shima, Masaki ; Sakata, Hitoshi ; Tanaka, Makoto
Author_Institution :
Adv. Energy Res. Center, Sanyo Electr. Co. Ltd., Hyogo
Abstract :
The world´s highest conversion efficiency levels of 21.8% (Voc: 0.718 V, Isc: 3.852 A, FF: 79.0%, confirmed by AIST) with a practical size of 100.4 cm2 has been achieved by using the HIT (hetero-junction with intrinsic thin layer) structure. This high efficiency has been mainly realized by the excellent c-Si/a-Si hetero-interface property obtained by our optimized surface cleaning process and high-quality and low-damage a-Si deposition technologies. This excellent c-Si/a-Si hetero-interface of the HIT structure results in a relatively high open circuit voltage (Voc) over 710 mV. Recently, we have succeeded in achieving an outstanding Voc of 730 mV for other efficient HIT solar cells. This result indicates the possibility of further improvement in the conversion efficiency of HIT solar cells. The higher Voc results in not only a higher conversion efficiency but also an improved temperature coefficient, which is another practical advantage for outdoor use
Keywords :
amorphous semiconductors; elemental semiconductors; semiconductor heterojunctions; semiconductor thin films; silicon; solar cells; surface cleaning; 21.8 percent; c-Si/a-Si hetero-interface; conversion efficiency; heterojunction structure; high-efficiency HIT solar cells; high-quality a-Si deposition technologies; intrinsic thin layer; low-damage a-Si deposition technologies; open circuit voltage; surface cleaning process; temperature coefficient; Circuits; Companies; Electrodes; Fingers; Oxidation; Passivation; Photovoltaic cells; Plasma temperature; Surface cleaning; Thermal stresses;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279743