Title :
FIESTA-EXTRA: cell-oriented software for the defect/fault analysis in VLSI circuits
Author :
Blyzniuk, M. ; Kazymyra, I.
Abstract :
The main concepts which laid the foundation for the special software development are considered. This software tool is named FIESTA-EXTRA (Faults Identification and EStimation of TestAbility by EXTRAction of faults probabilities, kinds of faults and usefulness of test patterns for faults detection) and is developed for defect/fault analysis in the complex gates from industrial cell library. Specific features of the main three extractors of the developed software are considered. The results of the FIESTA-ExTRA approbation are described.
Keywords :
VLSI; fault tolerant computing; integrated circuit design; integrated circuit manufacture; integrated circuit testing; FIESTA-EXTRA; VLSI circuits; cell-oriented software; complex gates; defect/fault analysis; Circuit analysis; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Pattern analysis; Programming; Software testing; Software tools; Very large scale integration;
Conference_Titel :
Microelectronics, 2004. 24th International Conference on
Print_ISBN :
0-7803-8166-1
DOI :
10.1109/ICMEL.2004.1314953
