Title :
Wide-pulse evaluation of 0.5 cm2 silicon carbide SGTO
Author :
O´Brien, Heather ; Ogunniyi, Aderinto ; Scozzie, Charles J. ; Shaheen, William ; Agarwal, Anant ; Temple, Victor
Author_Institution :
U.S. Army Res. Lab., Adelphi, MD, USA
fDate :
June 28 2009-July 2 2009
Abstract :
Silicon carbide Super-GTOs are being pursued by the Army as a replacement for current silicon-based, high-power pulse switches. In this study, 0.5 cm2 silicon carbide SGTOs were evaluated in an RLC pulse circuit which provided a half-sine shaped pulse at a width of 1 ms. The parameters assessed were peak current capability, 1000-shot reliability, and current sharing between parallel switches. SGTOs were pulsed as high as 1600 A, but 1250 A was found to be the most reliable and repeatable current level for most devices. This current waveform corresponds to an action of 850 A2s and a current density over the emitter area of 3.5 kA/cm2. SGTOs were pulsed for over 1000 single shots without any significant change in forward voltage drop. A pair of parallel SGTOs was pulsed up to a total of 2600 A, and repeatedly at 2500 A, with current sharing within ± 1%. This paper details the evaluations of individual and paralleled devices which are being studied in preparation for future work with multi-chip modules.
Keywords :
pulsed power switches; silicon compounds; wide band gap semiconductors; Army; RLC pulse circuit; SiC; Super-GTO; current 1250 A; current 1600 A; high-power pulse switches; multi-chip modules; time 1 ms; Current density; Laboratories; Power system reliability; Pulse circuits; Silicon carbide; Switches; Tellurium; Thermal conductivity; Vehicles; Voltage;
Conference_Titel :
Pulsed Power Conference, 2009. PPC '09. IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-4064-1
Electronic_ISBN :
978-1-4244-4065-8
DOI :
10.1109/PPC.2009.5386306