Title :
Dry processing of mc-silicon thin-film solar cells on foreign substrates leading to 11% efficiency
Author :
Ludemann, Ralf ; Schaefer, Sebastian ; Schule, Corina ; Hebling, Christopher
Author_Institution :
Fraunhofer-Inst. fur Solare Energiesysteme, Freiburg, Germany
fDate :
29 Sep-3 Oct 1997
Abstract :
A dry-chemical solar cell process has been developed by substituting conventional wet etching steps by reactive ion etching. The performance of mc-Si solar cells that have been made by this new technology is comparable to that of conventionally processed cells. Thin-film solar cells have been prepared by applying zone melting recrystallisation of CVD-grown, highly doped p+-Si layers, that were used as seeding layers for the growth of the active Si-layers. Graphite with two kinds of encapsulation have been used as a foreign substrate for the silicon deposition: (a) covered with conducting SiC, the graphite acts as base contact of the cells; and (b) graphite encapsulated with insulating SiC- and SiO2/SiN/SiO2-layers (ONO) leads to solar cells on insulating foreign substrates, with front side base contact. The graphite/SiC/Si layer system was developed by ASE; ONO deposition and recrystallisation were realised at Fraunhofer ISE. Applying the authors´ dry solar cell technology, conversion efficiencies up to 11% were achieved
Keywords :
CVD coatings; chemical vapour deposition; elemental semiconductors; semiconductor device manufacture; semiconductor device testing; semiconductor doping; semiconductor growth; semiconductor thin films; silicon; solar cells; sputter etching; substrates; zone melting recrystallisation; 11 percent; C-SiC-Si; CVD growth; Si; SiC-SiN-SiO2; SiO2-SiN-SiO2; base contact; conversion efficiency; dry-chemical manufacturing process; encapsulation; foreign substrates; highly doped p+ layers; photovoltaic performance; reactive ion etching; seeding layers; thin-film solar cells; zone melting recrystallisation; Costs; Etching; Photovoltaic cells; Plasma applications; Plasma chemistry; Plasma temperature; Semiconductor thin films; Silicon; Substrates; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-3767-0
DOI :
10.1109/PVSC.1997.654053