• DocumentCode
    320417
  • Title

    Effect of CdS annealing in (CdCl2+CdS) atmosphere on CdTe cells

  • Author

    Park, Sung Chan ; Han, Byung Wook ; Ahn, Jin Hyung ; Ahn, Byung Tae ; Kim, Donghwan

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    531
  • Lastpage
    534
  • Abstract
    To increase grain size, solution-grown CdS films were annealed at 560°C in a (CdCl2+CdS) atmosphere, instead of CdCl2 only environment. CdS was used to prevent the evaporation of CdS from the films. After 5 min annealing, the grain size increased from 10 nm to 100 nm and the surface morphology was very smooth and densely packed. The optical transmittance was greatly improved near Eg, compared to that of CdS films annealed at 400°C for 30 min in H2. The efficiency of the CdTe solar cell was improved by fabricating with the CdS layer annealed in a (CdCl2 +CdS) atmosphere. The increase of the efficiency was mainly due to the increase of fill factor, which might be due to the decrease of defects at CdTe bulk and the CdS/CdTe interface
  • Keywords
    II-VI semiconductors; annealing; cadmium compounds; crystal morphology; grain size; semiconductor growth; semiconductor thin films; solar cells; 10 to 100 nm; 30 min; 400 C; 5 min; 560 C; CdCl2-CdS; CdCl2/CdS atmosphere; CdS; CdS annealing; CdTe; CdTe bulk defects; CdTe cells; CdTe-CdS; annealing; fill factor; grain size; optical transmittance; solar cell efficiency; solution-grown CdS films; surface morphology; Annealing; Atmosphere; Cascading style sheets; Coatings; Grain size; Materials science and technology; Optical films; Powders; Scanning electron microscopy; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654145
  • Filename
    654145