Title :
Thermosensoric localization of defects in CIS solar modules
Author :
Gross, W. ; Zettner, J. ; Scheuerpflug, H. ; Hierl, Th. ; Schulz, M. ; Karg, F.
Author_Institution :
Bavarian Center for Appl. Energy Res., Erlangen, Germany
fDate :
29 Sep-3 Oct 1997
Abstract :
Thermal imaging by an infrared camera is proposed to localize material defects in solar cell modules. The method is demonstrated on two CuInSe2 minimodules consisting of 5 and 9 solar cells, respectively. Compared to the optical beam induced current (OBIC) method, the new thermosensoric defect localization (TDL) method is highly sensitive in solar modules and suitable for fabrication control. Shunts in the diode junction and series resistance in the semiconductor layer or the top contact may be differentiated
Keywords :
copper compounds; indium compounds; infrared imaging; semiconductor device testing; solar cell arrays; ternary semiconductors; thermal analysis; CuInSe2; CuInSe2 solar cell modules; diode junction shunts; fabrication control; infrared camera; semiconductor layer; series resistance; thermal imaging; thermosensoric defects localization; top contact; Cameras; Computational Intelligence Society; Infrared imaging; Optical beams; Optical control; Optical device fabrication; Optical imaging; Optical materials; Photovoltaic cells; Semiconductor diodes;
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-3767-0
DOI :
10.1109/PVSC.1997.654150
