• DocumentCode
    3204253
  • Title

    Current loss in the vacuum section of the refurbished Z accelerator

  • Author

    Pointon, T.D. ; Seidel, D.B.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2009
  • fDate
    June 28 2009-July 2 2009
  • Firstpage
    1159
  • Lastpage
    1164
  • Abstract
    There are two contributing factors to the current loss in the vacuum section of the Z accelerator at Sandia National Laboratories. Early in time, the loss can be accounted for solely by vacuum electron flow effects. Electrons emitted in the four magnetically insulated transmission lines (MITLs) flow into the convolute and are lost to anode surfaces, particularly in magnetic null regions. These losses can be modeled with standard electromagnetic, particle-in-cell (PIC) methods. Results of detailed 3-D PIC simulations are presented, showing good agreement with experiment early in the pulse, over a range of Z shots. However, late in the pulse, the simulations underestimate the observed loss in experiment, sometimes substantially. Electrode plasma effects in the convolute must be responsible for the additional loss. New PIC models to create an electrode plasma layer from first principles, using electron and ion particles, have been developed. It is shown that very small cell sizes (< 10 ¿m) are required to accurately resolve the expansion of electrode plasmas with T ~ 1 eV, into an anode-cathode gap with megavolts applied across it. Such small cell sizes are prohibitively small for 3-D convolute simulations.
  • Keywords
    Z pinch; plasma flow; 3-D convolute simulations; 3D PIC simulations; MITLs; Z accelerator; Z shots; anode surfaces; anode-cathode gap; current loss; electrode plasma effects; electrode plasma layer; electron particles; ion particles; magnetically insulated transmission lines; particle-in-cell methods; standard electromagnetic; vacuum electron flow effects; vacuum section; Acceleration; Anodes; Cathodes; Computational modeling; Electrodes; Electrons; Insulation; Joining processes; Plasma diagnostics; Plasma simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2009. PPC '09. IEEE
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-4064-1
  • Electronic_ISBN
    978-1-4244-4065-8
  • Type

    conf

  • DOI
    10.1109/PPC.2009.5386319
  • Filename
    5386319