• DocumentCode
    3204297
  • Title

    Leveraging COTS in an open system ATS architecture

  • Author

    Kulig, David M.

  • Author_Institution
    Div. of Defense Syst., Sanders & Lockheed Martin Co., Nashua, NH, USA
  • fYear
    1995
  • fDate
    8-10 Aug. 1995
  • Firstpage
    294
  • Lastpage
    299
  • Abstract
    The 1990s represent a time of accelerating growth in test requirements for Weapon Systems. This is coupled with a decrease in new weapon system starts. The Department of Defense (DoD) is driving toward open system architectures and maximum use of Commercial Off The Shelf (COTS) technology in its prime mission equipment and Automated Test Systems (ATS) designs. This presentation will discuss the evolution of the CASTE ATS design from a DOS platform using Sanders developed instrument drivers to a Microsoft Windows based implementation which leverages COTS toolset environments through industry standard software such as DLLs, Dynamic Data Exchange (DDE), and Virtual Instrument Software Architecture (VISA). Lessons learned related to COTS based software in the ATE industry will also be discussed.
  • Keywords
    automatic test software; computer interfaces; graphical user interfaces; integrated software; military computing; military standards; open systems; peripheral interfaces; software standards; software tools; weapons; CASTE ATS design; COTS toolset environments; DOS platform; Dynamic Data Exchange; Microsoft Windows based implementation; Virtual Instrument Software Architecture; automated test systems; commercial off the shelf technology; common automated software test executive; dynamic link libraries; industry standard software interfaces; instrument drivers; integrated system; life-cycle cost; mission requirements; open system architecture; scalable architecture; weapon system; Automatic testing; Computer industry; Instruments; Life estimation; Open systems; Software standards; Software tools; Standards development; System testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-2621-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.1995.522686
  • Filename
    522686