DocumentCode
3204345
Title
Rank modulation hardware for flash memories
Author
Kim, Mina ; Park, Jong Kap ; Twigg, Christopher M.
Author_Institution
Electr. & Comput. Eng. Dept., Binghamton Univ., Binghamton, NY, USA
fYear
2012
fDate
5-8 Aug. 2012
Firstpage
294
Lastpage
297
Abstract
Flash has been widely used as nonvolatile memories, such as secondary or long-term persistent storage, but it has recently been adopted for solid-state drives in many mobile applications. Advances in flash technology, such as multi-level cells and error correction, have improved storage density and reliability, but these characteristics continue to be a challenge as the technology scales to smaller dimensions. Most notably, these techniques have been unable to directly deal with the failures caused by block erasures, except by spreading out the erasures across the entire memory through wear leveling. Rank modulation provides a new approach to multi-level flash memory cells; it uses the relative ranking of cell levels, instead of their absolute values. A flash memory with rank modulation based upon winner-take-all circuits is proposed, simulated, and fabricated. Using rank modulation, memory reliability and capacity is further improved.
Keywords
flash memories; reliability; block erasures; error correction; flash memories; long term persistent storage; memory reliability; multilevel flash memory cells; nonvolatile memories; rank modulation hardware; solid state drives; storage density; wear leveling; winner-take-all circuits; Arrays; Ash; Encoding; Memory management; Modulation; Programming; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location
Boise, ID
ISSN
1548-3746
Print_ISBN
978-1-4673-2526-4
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2012.6292015
Filename
6292015
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