DocumentCode :
3204345
Title :
Rank modulation hardware for flash memories
Author :
Kim, Mina ; Park, Jong Kap ; Twigg, Christopher M.
Author_Institution :
Electr. & Comput. Eng. Dept., Binghamton Univ., Binghamton, NY, USA
fYear :
2012
fDate :
5-8 Aug. 2012
Firstpage :
294
Lastpage :
297
Abstract :
Flash has been widely used as nonvolatile memories, such as secondary or long-term persistent storage, but it has recently been adopted for solid-state drives in many mobile applications. Advances in flash technology, such as multi-level cells and error correction, have improved storage density and reliability, but these characteristics continue to be a challenge as the technology scales to smaller dimensions. Most notably, these techniques have been unable to directly deal with the failures caused by block erasures, except by spreading out the erasures across the entire memory through wear leveling. Rank modulation provides a new approach to multi-level flash memory cells; it uses the relative ranking of cell levels, instead of their absolute values. A flash memory with rank modulation based upon winner-take-all circuits is proposed, simulated, and fabricated. Using rank modulation, memory reliability and capacity is further improved.
Keywords :
flash memories; reliability; block erasures; error correction; flash memories; long term persistent storage; memory reliability; multilevel flash memory cells; nonvolatile memories; rank modulation hardware; solid state drives; storage density; wear leveling; winner-take-all circuits; Arrays; Ash; Encoding; Memory management; Modulation; Programming; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
ISSN :
1548-3746
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2012.6292015
Filename :
6292015
Link To Document :
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