Title :
Digitally programmable OTA-C low pass filter for ECG detection systems
Author :
Mahmoud, Soliman A. ; Bamakhramah, Ahmed ; Al-Tunaiji, Saeed A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Sharjah, Sharjah, United Arab Emirates
Abstract :
This paper presents the design of an operational transconductance amplifier-C (OTA-C) low pass filter for a portable electrocardiogram (ECG) detection system. A fifth-order Butterworth using ladder topology is utilized to reduce the effect of component tolerance and to provide a maximally flat response. The proposed filter is based on a novel class AB digitally programmable fully differential OTA circuit. Based on this, PSPICE simulation results for the filter using 0:25μm technology and operating under ±0:8V voltage supply are also given. The filter provides a third harmonic distortion (HD3) of 53.5dB for 100mVp-p sinusiodal input, input referred noise spectral density of 50μVrms/√Hz, total power consumption of 26μW and a bandwidth of 243Hz. These results demonstrate the ability of the filter to be used for ECG signal filtering which is located within 150Hz.
Keywords :
Butterworth filters; CMOS analogue integrated circuits; SPICE; UHF integrated circuits; circuit simulation; differential amplifiers; digital filters; electrocardiography; integrated circuit design; ladder filters; low-pass filters; medical signal detection; operational amplifiers; portable instruments; tolerance analysis; ECG detection systems; ECG signal filtering; HD3; PSPICE simulation; class AB digitally programmable fully differential OTA circuit; component tolerance effect reduction; digitally programmable OTA-C low pass filter design; fifth-order Butterworth filter; ladder topology; maximally flat response; noise spectral density; operational transconductance amplifier-C; portable electrocardiogram detection system; power 26 muW; power consumption; sinusiodal input; size 0.25 mum; third harmonic distortion; voltage supply; CMOS integrated circuits; Electrocardiography; Logic gates; Noise; Resistors; Simulation; Transistors;
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2012.6292029