• DocumentCode
    3204651
  • Title

    The road to commercialization in the PV industry: a case study of EFG technology

  • Author

    Henderson, E.J. ; Kalejs, J.P.

  • Author_Institution
    ASE Americas Inc., Billerica, MA, USA
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    1187
  • Lastpage
    1190
  • Abstract
    The successful commercialization of the PV industry will be a direct function of the effective management of the total cost of its delivered products. A central indicator of this success is a firm´s capability to attain and preserve a productivity advantage over its competitors in the market of choice. The interdependency of technical know-how and success in the business climate is measurable along multiple dimensions. Arguably among these indicators are issues related to technical intensity, the willingness and ability to deploy significant technological changes, and certainly sustainable market participation. Several dozen new silicon wafer production technologies have been introduced and taken to various levels of maturity over the past two decades. Here, the authors trace the development of edge-defined film-fed growth (EFG) technology from a fledgling R&D phase to commercialization in this paper within the context of a conventional experience curve for EFG technology
  • Keywords
    crystal growth from melt; economics; photovoltaic power systems; research and development management; semiconductor device manufacture; semiconductor growth; solar cell arrays; solar cells; PV industry; R&D efforts; business; commercialization; edge-defined film-fed growth technology; experience curve; market participation; productivity; silicon wafer production; technical intensity; technical maturity; technological change; Business; Commercialization; Computer aided software engineering; Costs; Crystallization; Manufacturing industries; Production; Research and development; Silicon; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564344
  • Filename
    564344