DocumentCode
3204736
Title
Noise effects in field-effect transistor biological sensor detection circuits
Author
Cantley, Kurtis D. ; Fernandes, Poornika G. ; Zhao, Mingyue ; Stiegler, Harvey J. ; Chapman, Richard A. ; Vogel, Eric M.
Author_Institution
Dept. of Mater. Sci. & Eng., Univ. of Texas at Dallas, Richardson, TX, USA
fYear
2012
fDate
5-8 Aug. 2012
Firstpage
370
Lastpage
373
Abstract
Affinity-based biological sensor field-effect transistors (BioFETs) exhibit a large amount of noise in their drain current under constant bias. In this work, we use SPICE to simulate the effect of sensor noise on a differential pair amplifier detection circuit. This is accomplished by the generation of a realistic noise signal with 1/f power spectrum which is applied to the back gate and reference electrode of a nanoribbon BioFET sensor. The resulting output signal from the transient simulation is time-averaged to obtain the noise rms amplitude. The ability to distinguish the sensor signal from the noisy environment is examined for various amounts of noise power and integration time. Corresponding minimum theoretical direct detection limits for of Biotin-Streptavidin attachment and DNA hybridization are also provided, along with discussion of possible methods to reduce the noise effects.
Keywords
SPICE; field effect transistors; sensors; DNA hybridization; SPICE; affinity based biological sensor field effect transistor; back gate; biotin streptavidin attachment; constant bias; differential pair amplifier detection circuit; direct detection limits; drain current; field effect transistor biological sensor detection circuit; integration time; nanoribbon BioFET sensor; noise effect; noise power; noisy environment; output signal; power spectrum; realistic noise signal; reference electrode; sensor noise; sensor signal; transient simulation; Biological system modeling; Biomembranes; Biosensors; Integrated circuit modeling; Logic gates; Noise; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location
Boise, ID
ISSN
1548-3746
Print_ISBN
978-1-4673-2526-4
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2012.6292034
Filename
6292034
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