• DocumentCode
    3204860
  • Title

    Results of five years of module qualification testing to CEC Specification 503 [solar cell arrays]

  • Author

    Bishop, J. ; Ossenbrink, H.

  • Author_Institution
    EC DGJRC ESTI, Ispra, Italy
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    1191
  • Lastpage
    1196
  • Abstract
    Solar cell module failures observed during qualification testing to CEC Specification 503 on 96 crystalline silicon solar cell module types are described. Of these 96 types, 22 exhibited major defects and 9 failed to meet qualification requirements. The effects of the environmental tests are presented, and used to propose test sequences for extending certification following module design changes
  • Keywords
    certification; elemental semiconductors; failure analysis; semiconductor device reliability; semiconductor device testing; silicon; solar cell arrays; solar cells; standards; CEC Specification 503; PV module failures; Si; crystalline Si solar cells; defects; environmental tests; qualification requirements; qualification testing; solar cell modules; Circuit testing; Crystallization; Dielectrics and electrical insulation; Electric variables measurement; IEC standards; Inspection; Insulation testing; Mechanical variables measurement; Qualifications; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564345
  • Filename
    564345