Title :
Diffraction pattern of a Gauss beam by a thick slit
Author :
Alvarez-Cabanillas, M.
Author_Institution :
Dept. of High Freq., Inst. Politecnico Nacional, Mexico City, Mexico
Abstract :
The electromagnetic field diffracted by a thick slit utilizing a rigorous diffraction theory was studied. The far-field and the intensity of the transmitted radiation of an incident polarized Gaussian beam was calculated. A transversal electric (TE) and magnetic (TM) polarization was considered. The effects over the radiation pattern of the finite beam and its polarization as well as the geometrical parameters of the slit were studied.
Keywords :
Gaussian processes; antenna radiation patterns; electromagnetic wave diffraction; electromagnetic wave polarisation; Gauss beam; TE polarization; TM polarization; diffraction pattern; electromagnetic field; far-field; finite beam; incident polarized Gaussian beam; radiation pattern; rigorous diffraction theory; slit geometrical parameters; thick slit; transmitted radiation; Apertures; Boundary conditions; Electromagnetic diffraction; Electromagnetic fields; Electromagnetic wave polarization; Equations; Frequency; Gaussian processes; Magnetic fields; Tellurium;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-4478-2
DOI :
10.1109/APS.1998.701645
