DocumentCode
3204901
Title
Diffraction pattern of a Gauss beam by a thick slit
Author
Alvarez-Cabanillas, M.
Author_Institution
Dept. of High Freq., Inst. Politecnico Nacional, Mexico City, Mexico
Volume
4
fYear
1998
fDate
21-26 June 1998
Firstpage
2164
Abstract
The electromagnetic field diffracted by a thick slit utilizing a rigorous diffraction theory was studied. The far-field and the intensity of the transmitted radiation of an incident polarized Gaussian beam was calculated. A transversal electric (TE) and magnetic (TM) polarization was considered. The effects over the radiation pattern of the finite beam and its polarization as well as the geometrical parameters of the slit were studied.
Keywords
Gaussian processes; antenna radiation patterns; electromagnetic wave diffraction; electromagnetic wave polarisation; Gauss beam; TE polarization; TM polarization; diffraction pattern; electromagnetic field; far-field; finite beam; incident polarized Gaussian beam; radiation pattern; rigorous diffraction theory; slit geometrical parameters; thick slit; transmitted radiation; Apertures; Boundary conditions; Electromagnetic diffraction; Electromagnetic fields; Electromagnetic wave polarization; Equations; Frequency; Gaussian processes; Magnetic fields; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-4478-2
Type
conf
DOI
10.1109/APS.1998.701645
Filename
701645
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