• DocumentCode
    3205065
  • Title

    Breakdown in RF Cavities

  • Author

    Norem, J. ; Hassanein, A. ; Insepov, Z. ; Konkashbaev, I.

  • Author_Institution
    ANL, Argonne, IL 60439, U.S.A., norem@anl.gov
  • fYear
    2005
  • fDate
    16-20 May 2005
  • Firstpage
    1886
  • Lastpage
    1888
  • Abstract
    We present a simple model of breakdown in rf cavities. For most events this involves tensile stress and tensile strength, however other effects can also contribute. We discuss the effects of different materials, fatigue, high pressure gas, primary and secondary emission sites, local field enhancements, dark currents, secondary emission, work functions, magnetic fields, macro and microscopic fracture mechanisms high current densities, surface and subsurface defects, and astronomical power densities. While primarily devoted to normal conductors, this work also has consequences for superconducting rf surfaces.
  • Keywords
    Conducting materials; Dark current; Electric breakdown; Fatigue; Magnetic force microscopy; Magnetic materials; Radio frequency; Superconducting materials; Surface cracks; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
  • Print_ISBN
    0-7803-8859-3
  • Type

    conf

  • DOI
    10.1109/PAC.2005.1590946
  • Filename
    1590946