DocumentCode
3205065
Title
Breakdown in RF Cavities
Author
Norem, J. ; Hassanein, A. ; Insepov, Z. ; Konkashbaev, I.
Author_Institution
ANL, Argonne, IL 60439, U.S.A., norem@anl.gov
fYear
2005
fDate
16-20 May 2005
Firstpage
1886
Lastpage
1888
Abstract
We present a simple model of breakdown in rf cavities. For most events this involves tensile stress and tensile strength, however other effects can also contribute. We discuss the effects of different materials, fatigue, high pressure gas, primary and secondary emission sites, local field enhancements, dark currents, secondary emission, work functions, magnetic fields, macro and microscopic fracture mechanisms high current densities, surface and subsurface defects, and astronomical power densities. While primarily devoted to normal conductors, this work also has consequences for superconducting rf surfaces.
Keywords
Conducting materials; Dark current; Electric breakdown; Fatigue; Magnetic force microscopy; Magnetic materials; Radio frequency; Superconducting materials; Surface cracks; Tensile stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
Print_ISBN
0-7803-8859-3
Type
conf
DOI
10.1109/PAC.2005.1590946
Filename
1590946
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