DocumentCode :
3205145
Title :
Design considerations for a PEBB-based Marx-topology ILC klystron modulator
Author :
Macken, K. ; Beukers, T. ; Burkhart, C. ; Kemp, M.A. ; Nguyen, M.N. ; Tang, T.
Author_Institution :
SLAC Nat. Accel. Lab., Menlo Park, CA, USA
fYear :
2009
fDate :
June 28 2009-July 2 2009
Firstpage :
811
Lastpage :
816
Abstract :
The concept of Power Electronic Building Blocks (PEBBs) has its origin in the U.S. Navy during the last decade of the past century. As compared to a more conventional or classical design approach, a PEBB-oriented design approach combines various potential advantages such as increased modularity, high availability, and simplified serviceability. This relatively new design paradigm for power conversion has progressively matured since then and its underlying philosophy has been clearly and successfully demonstrated in a number of real-world applications. Therefore, this approach has been adopted here to design a Marx-topology modulator for an International Linear Collider (ILC) environment where easy serviceability and high availability are crucial. This paper describes various aspects relating to the design of a 32-cell Marx-topology ILC klystron modulator. The concept of nested droop correction is introduced and illustrated. Several design considerations including cosmic ray withstand, power cycling capability, fault tolerance, etc., are discussed. Details of the design of a Marx cell PEBB are included.
Keywords :
klystrons; linear colliders; nuclear electronics; power conversion; power electronics; pulsed power supplies; International Linear Collider environment; Marx-topology; Power Electronic Building Blocks; classical design approach; fault tolerance; klystron modulator; nested droop correction; power cycling capability; Availability; Communication system control; Fault tolerance; Filters; Klystrons; Power conversion; Power electronics; Switches; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 2009. PPC '09. IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-4064-1
Electronic_ISBN :
978-1-4244-4065-8
Type :
conf
DOI :
10.1109/PPC.2009.5386366
Filename :
5386366
Link To Document :
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