DocumentCode
3205205
Title
Smart E-O targets as versatile, self-contained instruments
Author
Bates, Kenn
Author_Institution
Depot & Test Syst., Hughes Tech. Services Co., Long Beach, CA, USA
fYear
1995
fDate
8-10 Aug. 1995
Firstpage
328
Lastpage
331
Abstract
Current Electro-Optical (E-O) testing requirements have demanded a shift to reduced cost, off-the-shelf technology. While Hughes Technical Services Company (HTSC) has worked toward developing downsized collimators to meet this demand, this proves to be only part of the solution. Highly versatile, self-contained, replaceable E-O targets are also required to meet this need. The Depot and Test Systems Division within HTSC has developed a standard for replaceable E-O targets. These Integrated Target Assemblies (ITA) must test such various systems as: FLIR, Near Infrared (NIR) tracker, Visual Telescope, TV Video, and Laser LRF/LTD. Smart targets have been designed which are interchangeable; can perform built in tests (BITs); contain their own calibration data stored electronically; correct their performance using sophisticated DSP algorithms; as well as automatically correct their own boresight alignment. A suite of such targets would be invisible to the user and would act in concert as versatile instruments containing all the functionality required for testing any number of prime systems.
Keywords
automatic test equipment; calibration; electro-optical devices; emissivity; military equipment; mirrors; optical collimators; DSP algorithms; boresight alignment correction; built in tests; calibration data; downsized collimators; electro-optical testing; emissivity target; integrated target assemblies; military testing; smart targets; versatile self-contained instruments; Algorithm design and analysis; Assembly systems; Collimators; Costs; Instruments; Standards development; System testing; TV; Target tracking; Telescopes;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-2621-0
Type
conf
DOI
10.1109/AUTEST.1995.522691
Filename
522691
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