• DocumentCode
    3205205
  • Title

    Smart E-O targets as versatile, self-contained instruments

  • Author

    Bates, Kenn

  • Author_Institution
    Depot & Test Syst., Hughes Tech. Services Co., Long Beach, CA, USA
  • fYear
    1995
  • fDate
    8-10 Aug. 1995
  • Firstpage
    328
  • Lastpage
    331
  • Abstract
    Current Electro-Optical (E-O) testing requirements have demanded a shift to reduced cost, off-the-shelf technology. While Hughes Technical Services Company (HTSC) has worked toward developing downsized collimators to meet this demand, this proves to be only part of the solution. Highly versatile, self-contained, replaceable E-O targets are also required to meet this need. The Depot and Test Systems Division within HTSC has developed a standard for replaceable E-O targets. These Integrated Target Assemblies (ITA) must test such various systems as: FLIR, Near Infrared (NIR) tracker, Visual Telescope, TV Video, and Laser LRF/LTD. Smart targets have been designed which are interchangeable; can perform built in tests (BITs); contain their own calibration data stored electronically; correct their performance using sophisticated DSP algorithms; as well as automatically correct their own boresight alignment. A suite of such targets would be invisible to the user and would act in concert as versatile instruments containing all the functionality required for testing any number of prime systems.
  • Keywords
    automatic test equipment; calibration; electro-optical devices; emissivity; military equipment; mirrors; optical collimators; DSP algorithms; boresight alignment correction; built in tests; calibration data; downsized collimators; electro-optical testing; emissivity target; integrated target assemblies; military testing; smart targets; versatile self-contained instruments; Algorithm design and analysis; Assembly systems; Collimators; Costs; Instruments; Standards development; System testing; TV; Target tracking; Telescopes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-2621-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.1995.522691
  • Filename
    522691