DocumentCode
3205615
Title
On-line inspection of surface mount devices using vision and infrared sensors
Author
Dar, Lqbal M. ; Newman, Kimberly E. ; Vachtsevanos, George
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
fYear
1995
fDate
8-10 Aug. 1995
Firstpage
376
Lastpage
384
Abstract
This paper introduces a methodology for online inspection of surface mount components using vision and infrared sensors. The complementary nature of vision and infrared sensors allows for separation of solder joint defects into surface level defects and solder mass related defects for defect detection. The vision sensor can provide reliable information for surface level defects while infrared sensors are capable of providing information about solder mass related defects. An experimental facility is described and software routines developed for defect defection. Using both oblique and flat illumination techniques, the 2-dimensional gray scale images of the printed circuit boards are captured and preprocessed for suitable feature extraction. A sampling scheme has been developed for infrared inspection to reduce the inspection time. For defect detection a neural network construct is used to compare incoming data with stored templates. In addition, a classifier based on fuzzy relations and linguistic labels has been used to perform classification of linear misalignment defect accommodating the uncertainty associated with it. The strategy is demonstrated with inspection of a number of solder joint defects.
Keywords
CCD image sensors; automatic optical inspection; automatic test software; feature extraction; fuzzy neural nets; image classification; infrared imaging; perceptrons; printed circuit manufacture; printed circuit testing; soldering; surface mount technology; 2-dimensional gray scale images; defect detection; feature extraction; fuzzy relations; infrared inspection; infrared sensors; linear misalignment defect; linguistic labels; neural network; on-line inspection; printed circuit boards; sampling scheme; separation of solder joint defects; software routines; solder mass related defects; surface level defects; surface mount devices; vision sensor; Feature extraction; Image sampling; Infrared detectors; Infrared sensors; Inspection; Lighting; Neural networks; Printed circuits; Soldering; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-2621-0
Type
conf
DOI
10.1109/AUTEST.1995.522699
Filename
522699
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