DocumentCode :
3205615
Title :
On-line inspection of surface mount devices using vision and infrared sensors
Author :
Dar, Lqbal M. ; Newman, Kimberly E. ; Vachtsevanos, George
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1995
fDate :
8-10 Aug. 1995
Firstpage :
376
Lastpage :
384
Abstract :
This paper introduces a methodology for online inspection of surface mount components using vision and infrared sensors. The complementary nature of vision and infrared sensors allows for separation of solder joint defects into surface level defects and solder mass related defects for defect detection. The vision sensor can provide reliable information for surface level defects while infrared sensors are capable of providing information about solder mass related defects. An experimental facility is described and software routines developed for defect defection. Using both oblique and flat illumination techniques, the 2-dimensional gray scale images of the printed circuit boards are captured and preprocessed for suitable feature extraction. A sampling scheme has been developed for infrared inspection to reduce the inspection time. For defect detection a neural network construct is used to compare incoming data with stored templates. In addition, a classifier based on fuzzy relations and linguistic labels has been used to perform classification of linear misalignment defect accommodating the uncertainty associated with it. The strategy is demonstrated with inspection of a number of solder joint defects.
Keywords :
CCD image sensors; automatic optical inspection; automatic test software; feature extraction; fuzzy neural nets; image classification; infrared imaging; perceptrons; printed circuit manufacture; printed circuit testing; soldering; surface mount technology; 2-dimensional gray scale images; defect detection; feature extraction; fuzzy relations; infrared inspection; infrared sensors; linear misalignment defect; linguistic labels; neural network; on-line inspection; printed circuit boards; sampling scheme; separation of solder joint defects; software routines; solder mass related defects; surface level defects; surface mount devices; vision sensor; Feature extraction; Image sampling; Infrared detectors; Infrared sensors; Inspection; Lighting; Neural networks; Printed circuits; Soldering; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
Type :
conf
DOI :
10.1109/AUTEST.1995.522699
Filename :
522699
Link To Document :
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