• DocumentCode
    3205878
  • Title

    Bipolar amplifier bias technique for robust IM3 null tracking independent of internal emitter resistance

  • Author

    Balsom, Toby ; Redman-White, William ; Scott, Jonathan

  • Author_Institution
    Sch. of Eng., Univ. of Waikato, Hamilton, New Zealand
  • fYear
    2012
  • fDate
    5-8 Aug. 2012
  • Firstpage
    606
  • Lastpage
    609
  • Abstract
    Bipolar amplifiers can be biased to give a deep null in third order non-linearity, with the potential for high IP3 amplifier stages. This requires maintaining a precise voltage drop across a small resistive emitter degeneration resistance, whose value is related to kT/q. To make such a scheme practical, the bias must not only take into account the change in kT/q with temperature, but must compensate for variations in the degeneration resistance. In this paper we present a bias technique for IM3 null tracking that can take account of temperature and resistance tolerances, and is also insensitive to the value of the internal emitter resistance. Simulations using a 27 GHz BiCMOS technology indicate that the bias of an amplifier can be maintained over temperature, representative element tolerances, and mismatch such that the IP3 performance is maintained within ±9.5 dBV of the optimum null condition. The technique is applicable for a range of bipolar BiCMOS technologies and is attractive for amplifiers where high IP3 is required with moderate noise figure.
  • Keywords
    BiCMOS integrated circuits; amplifiers; BiCMOS technology; bipolar BiCMOS technologies; bipolar amplifier bias technique; frequency 27 GHz; high IP3 amplifier stages; internal emitter resistance; resistance tolerance; resistive emitter degeneration resistance; robust IM3 null tracking; temperature tolerance; third order nonlinearity; voltage drop; BiCMOS integrated circuits; Educational institutions; Equations; Integrated circuit modeling; Mirrors; Resistance; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
  • Conference_Location
    Boise, ID
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4673-2526-4
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2012.6292093
  • Filename
    6292093