DocumentCode
3205901
Title
Thin-Film Photovoltaic Radiation Testing for Space Applications
Author
Liu, Simon H. ; Granata, Jennifer E. ; Nocerino, John C. ; Halpine, John S. ; Simburger, Edward J.
Author_Institution
Aerosp. Corp., El Segundo, CA
Volume
2
fYear
2006
fDate
38838
Firstpage
1876
Lastpage
1878
Abstract
Although thin-film photovoltaic technology on lightweight flexible substrates has lower beginning-of-life efficiency compared to traditional single crystalline solar cells, it can offer advantages in high-specific power and low-stowed volume for power generation in space. To date, radiation testing on thin-film solar cells has demonstrated superior radiation hardness compared to traditional crystalline solar cells. In addition, radiation induced damage in thin-film solar cells can be removed by annealing at temperatures readily achievable in space. Prior to deployment of this new technology for any mission, a more thorough understanding of its performance in the space environment will be required. The Aerospace Corporation has initiated a comprehensive study of thin-film solar cell performance in a simulated space radiation environment. A new testbed has been constructed to study the combined space environmental effect of proton irradiation and air mass zero light spectrum light soaking on a thin-film photovoltaic
Keywords
annealing; environmental degradation; proton effects; radiation hardening (electronics); semiconductor device testing; solar cells; space power generation; thin film devices; air mass zero light spectrum; annealing; light soaking effects; lightweight flexible substrates; proton irradiation; radiation hardness; radiation induced damage; space environmental degradation; space solar cells; thin-film photovoltaic radiation testing; Annealing; Crystallization; Photovoltaic cells; Photovoltaic systems; Solar power generation; Space technology; Substrates; Temperature; Testing; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location
Waikoloa, HI
Print_ISBN
1-4244-0017-1
Electronic_ISBN
1-4244-0017-1
Type
conf
DOI
10.1109/WCPEC.2006.279861
Filename
4060027
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