Title :
Thin-Film Photovoltaic Radiation Testing for Space Applications
Author :
Liu, Simon H. ; Granata, Jennifer E. ; Nocerino, John C. ; Halpine, John S. ; Simburger, Edward J.
Author_Institution :
Aerosp. Corp., El Segundo, CA
Abstract :
Although thin-film photovoltaic technology on lightweight flexible substrates has lower beginning-of-life efficiency compared to traditional single crystalline solar cells, it can offer advantages in high-specific power and low-stowed volume for power generation in space. To date, radiation testing on thin-film solar cells has demonstrated superior radiation hardness compared to traditional crystalline solar cells. In addition, radiation induced damage in thin-film solar cells can be removed by annealing at temperatures readily achievable in space. Prior to deployment of this new technology for any mission, a more thorough understanding of its performance in the space environment will be required. The Aerospace Corporation has initiated a comprehensive study of thin-film solar cell performance in a simulated space radiation environment. A new testbed has been constructed to study the combined space environmental effect of proton irradiation and air mass zero light spectrum light soaking on a thin-film photovoltaic
Keywords :
annealing; environmental degradation; proton effects; radiation hardening (electronics); semiconductor device testing; solar cells; space power generation; thin film devices; air mass zero light spectrum; annealing; light soaking effects; lightweight flexible substrates; proton irradiation; radiation hardness; radiation induced damage; space environmental degradation; space solar cells; thin-film photovoltaic radiation testing; Annealing; Crystallization; Photovoltaic cells; Photovoltaic systems; Solar power generation; Space technology; Substrates; Temperature; Testing; Transistors;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279861