Evaluation of ESD Susceptibility of Solar Cells with a Monolithic Bypass Diode

Author

Clevenger, Brad ; Hise, Lawson ; Newman, Fred ; Aiken, Dan ; Sharps, Paul

Author_Institution

Emcore Photovoltaics, Albuquerque, NM

Volume

2

fYear

2006

fDate

38838

Firstpage

1931

Lastpage

1934

Abstract

The combination of solar cell and bypass diode is a determining factor in a product´s resistance to on orbit damage from electrostatic discharge (ESD). In this paper, Emcore´s bypass diode integration strategies and the effects of ESD on fully interconnected ATJ and ATJM solar cells is discussed. Results from pulse-injection ESD testing are presented for solar cells incorporating various diodes to illustrate the dependence of ESD damage threshold on diode design. ATJM products display a range of results during pulse-injection testing, with some designs showing no performance degradation after repeated exposures to >150 A discharges. Damage thresholds for the products are quantified and shown to be less dependent on bypass diode type than on 010 circuit series resistance. The result provides a means by which ATJM products can be tailored to withstand severe ESD conditions

Keywords

electrostatic discharge; solar cells; 010 circuit series resistance; ESD damage threshold; ESD susceptibility; Emcore´s bypass diode integration strategy; electrostatic discharge; interconnected ATJ solar cells; interconnected ATJM solar cells; monolithic bypass diode; orbit damage; pulse-injection ESD testing; Assembly; Circuit testing; Costs; Displays; Electrostatic discharge; Integrated circuit interconnections; Photovoltaic cells; Semiconductor diodes; Soldering; Welding;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on

Conference_Location

Waikoloa, HI

Print_ISBN

1-4244-0017-1

Electronic_ISBN

1-4244-0017-1

Type

conf

DOI

10.1109/WCPEC.2006.279875

Filename

4060041