Pulse power electromagnetic fields, rep-rate influence on electromagnetic effects

Some results obtained during experimental measurements of susceptibility of electronics to HPM and UWB irradiation with repetition rate signals are presented in this paper. Repetition rate dependence is considered for temporary failures as well as for damage levels too. As equipments under test are chosen regular PC setups. Simple electronic circuit are added for some experiments for possibility to achieve more results related to damage levels. Suitable simplified circuit models for HPM and UWB repetition rate effectiveness for achieving of typical effects on electronics is used for simulations. For this purpose model based on electro-thermal analogy is used within the software OrCAD 15.7 (PSpice model) environment. Results from measurements are compared with results from simulations. At the end of this presentation recommendation for effective HPM and UWB rep-rate necessary to achieve typical failures of tested equipments is carried out.