DocumentCode
3206238
Title
Study and characterization of lunar craters using Mini-SAR data of Chandrayaan-1
Author
Mishra, P. ; Rajashekhar, U. ; Singh, D.
Author_Institution
Dept. of Electron. & Commun. Eng., Indian Inst. of Technol. Roorkee, Roorkee, India
fYear
2013
fDate
13-15 Dec. 2013
Firstpage
1
Lastpage
5
Abstract
Analyzing lunar surface with various approaches is still a very challenging task. Therefore, in this paper, an attempt has been made to critically analyze the lunar surface by using various approaches so that the possibility of water ice can be predicted. The polarimetric approach helps in determining physical and electrical properties of target. The polarimetric approaches, `m-δ´ decomposition [1, 2] and `m-χ´ decomposition [3], have been used for obtaining the information of scattering mechanisms. In order to determine electrical properties of lunar surface, dielectric constant has been measured using Campbell´s approach [4]. Then, specular diffuse model [5] has been applied for identifying various craters with reference to surface roughness and possibility of water-ice deposits.
Keywords
astronomical instruments; dielectric measurement; dielectric properties; electromagnetic wave scattering; ice; lunar surface; radar polarimetry; remote sensing by radar; surface roughness; synthetic aperture radar; CHANDRAYAAN-l; Campbell approach; dielectric constant measurement; electrical properties; lunar crater characterization; lunar surface analysis; m-δ decomposition; m-χ decomposition; mini-SAR data; polarimetric approach; scattering mechanisms; surface roughness; water-ice deposit possibility; Ice; Radio frequency; Remote sensing; Rough surfaces; Scattering; Stokes parameters; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Photonics (ICMAP), 2013 International Conference on
Conference_Location
Dhanbad
Print_ISBN
978-1-4799-2176-8
Type
conf
DOI
10.1109/ICMAP.2013.6733449
Filename
6733449
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