DocumentCode :
3206276
Title :
C-17 integrated avionics maintenance
Author :
Cross, Kent ; Sidhwa, Frank
Author_Institution :
GDE Syst. Inc., San Diego, CA, USA
fYear :
1995
fDate :
8-10 Aug. 1995
Firstpage :
420
Lastpage :
425
Abstract :
Application of the existing Integrated Maintenance Information System (IMIS) to the C-17 weapon system can provide significantly improved weapon system maintenance capability, which will result in reduced support system life-cycle costs. IMIS supplies maintenance technicians with direct access to maintenance information systems and databases, including historical data, supply data, technical manuals, and automated training systems. IMIS interrogates built-in test (BIT) from on-board avionics systems, displays digital technical orders integrated with diagnostic and repair advice, automatically records maintenance actions, and provides a ready means of ordering replacement parts at the job site. The integration of information sources provided by IMIS is an element in the overall C-17 integrated and paperless avionics support environment concept, linking the organizational, intermediate, and depot levels of maintenance.
Keywords :
aerospace expert systems; aircraft computers; aircraft maintenance; aircraft testing; automatic test equipment; automatic test software; diagnostic expert systems; fault diagnosis; military aircraft; military avionics; military computing; user interface management systems; weapons; C-17 weapon system; built-in test; depot level; digital technical orders; integrated avionics maintenance; integrated maintenance information system; intelligent statistical diagnostics; intermediate level; military aircraft; on-board avionics systems; open architecture; organizational level; paperless avionics support environment concept; reduced support system life-cycle costs; user interface; Aerospace control; Aerospace electronics; Aircraft; Computer displays; Computerized monitoring; Information systems; Laboratories; Manuals; Testing; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
Type :
conf
DOI :
10.1109/AUTEST.1995.522705
Filename :
522705
Link To Document :
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