Data Analysis of Electrical Performance Measurements from 15 Years of Module Qualification Tests

Author

Sample, T. ; Skoczek, A. ; Dunlop, E.D. ; Ossenbrink, H.A.

Author_Institution

DG Joint Res. Centre IES, Eur. Comm., Ispra

Volume

2

fYear

2006

fDate

7-12 May 2006

Firstpage

2042

Lastpage

2045

Abstract

Qualification tests of terrestrial photovoltaic (PV) modules have been carried out at the European solar test installation of the European Commission´s Joint research centre, Ispra from 1981. Since 1990, all tests have been based on the IEC 61215 Standard, or its direct predecessor, Specification 503 [1] The performance measurements on all of these modules now form an extensive database of results for electric performance degradation, after applied qualification tests. Many of the stress tests results obtained by the ESTI Laboratory have already been published and presented [2] [3].This paper presents statistical analysis of selected results of the behavior of crystalline silicon modules from the data base of modules tested from 1990 up to 2006

Keywords

IEC standards; elemental semiconductors; silicon; solar cells; statistical analysis; ESTI Laboratory; European Commission´s Joint research centre; European solar test installation; IEC 61215 Standard; Ispra; Si; crystalline silicon modules; electrical performance measurement; module qualification test; statistical analysis; terrestrial photovoltaic data analysis; Data analysis; Databases; Degradation; IEC standards; Measurement standards; Photovoltaic systems; Qualifications; Solar power generation; Stress; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on

Conference_Location

Waikoloa, HI

Print_ISBN

1-4244-0016-3

Electronic_ISBN

1-4244-0017-1

Type

conf

DOI

10.1109/WCPEC.2006.279903

Filename

4060069