DocumentCode
3206717
Title
Long Term Reliability of Photovoltaic Modules
Author
Wohlgemuth, John H. ; Cunningham, Daniel W. ; Monus, Paul ; Miller, Jay ; Nguyen, Andy
Author_Institution
BP Solar Int. Inc., Frederick, MD
Volume
2
fYear
2006
fDate
38838
Firstpage
2050
Lastpage
2053
Abstract
BP Solar has utilized long term module exposure data and field return data to determine module lifetimes, expected failure rates and to identify failure mechanisms. While outdoor testing is a must for understanding PV reliability, it takes much too long to be of use in determining the effects of changes in materials, processes or equipment. This paper describes how BP Solar utilizes accelerated stress testing to verify the robustness of its new PV products
Keywords
life testing; reliability; solar cells; PV reliability; accelerated stress testing; expected failure rates; failure mechanism identification; long term reliability; module lifetime determination; outdoor testing; photovoltaic modules; Failure analysis; IEC standards; Life estimation; Materials reliability; Materials testing; Photovoltaic systems; Qualifications; Solar power generation; Stress; Warranties;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location
Waikoloa, HI
Print_ISBN
1-4244-0017-1
Electronic_ISBN
1-4244-0017-1
Type
conf
DOI
10.1109/WCPEC.2006.279905
Filename
4060071
Link To Document