Title :
A New Assessment Method for System Reliability Based on Dynamic Fault Tree
Author :
Rongxing, Duan ; Guochun, Wan ; Decun, Dong
Author_Institution :
Tongji Univ., Shanghai, China
Abstract :
According to the deficiency of traditional Markov chain approach in dynamic fault tree analysis, a new modular method for system reliability analysis is proposed. This paper focuses on dividing the fault tree of system into independent subtrees using a linear-time algorithm, and the processing method for different subtrees: Binary decision diagram solution for static subtrees and Bayesian Network solution for dynamic subtrees, respectively. In addition, an approach is also provided for mapping some dynamic logic gates into discrete-time Bayesian network. At last, the modular method has been applied to assess the reliability of a satellite key device and the results have shown that the proposed method can overcome the state explosion problem, and is useful for assessing the reliability of large and complex systems.
Keywords :
Markov processes; belief networks; binary decision diagrams; fault trees; logic gates; Bayesian Network; Markov chain; binary decision diagram; discrete- time network; dynamic fault tree analysis; dynamic logic gates; independent subtrees; linear-time algorithm; satellite key device; system reliability analysis; Bayesian methods; Binary decision diagrams; Boolean functions; Data structures; Explosions; Fault trees; Logic devices; Logic gates; Reliability; State-space methods; Bayesian Network; Binary Decision Diagram; Dynamic Fault Tree; Reliability Assessment;
Conference_Titel :
Intelligent Computation Technology and Automation (ICICTA), 2010 International Conference on
Conference_Location :
Changsha
Print_ISBN :
978-1-4244-7279-6
Electronic_ISBN :
978-1-4244-7280-2
DOI :
10.1109/ICICTA.2010.237
