A New Assessment Method for System Reliability Based on Dynamic Fault Tree

Author

Rongxing, Duan ; Guochun, Wan ; Decun, Dong

Author_Institution

Tongji Univ., Shanghai, China

Volume

1

fYear

2010

fDate

11-12 May 2010

Firstpage

219

Lastpage

222

Abstract

According to the deficiency of traditional Markov chain approach in dynamic fault tree analysis, a new modular method for system reliability analysis is proposed. This paper focuses on dividing the fault tree of system into independent subtrees using a linear-time algorithm, and the processing method for different subtrees: Binary decision diagram solution for static subtrees and Bayesian Network solution for dynamic subtrees, respectively. In addition, an approach is also provided for mapping some dynamic logic gates into discrete-time Bayesian network. At last, the modular method has been applied to assess the reliability of a satellite key device and the results have shown that the proposed method can overcome the state explosion problem, and is useful for assessing the reliability of large and complex systems.

Keywords

Markov processes; belief networks; binary decision diagrams; fault trees; logic gates; Bayesian Network; Markov chain; binary decision diagram; discrete- time network; dynamic fault tree analysis; dynamic logic gates; independent subtrees; linear-time algorithm; satellite key device; system reliability analysis; Bayesian methods; Binary decision diagrams; Boolean functions; Data structures; Explosions; Fault trees; Logic devices; Logic gates; Reliability; State-space methods; Bayesian Network; Binary Decision Diagram; Dynamic Fault Tree; Reliability Assessment;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Computation Technology and Automation (ICICTA), 2010 International Conference on

Conference_Location

Changsha

Print_ISBN

978-1-4244-7279-6

Electronic_ISBN

978-1-4244-7280-2

Type

conf

DOI

10.1109/ICICTA.2010.237

Filename

5523435