Nonlinear analysis of f/sub 0//2 loop oscillation of high power amplifiers

Author

Mochizuki, Marie ; Nakayama, Makoto ; Tarui, Yoichiro ; Itoh, Yoshio ; Tsuji, Satoshi ; Takagi, Toshiyuki

Author_Institution

Electro-Opt. & Microwave Syst. Lab., Mitsubishi Electr. Corp., Kanagawa, Japan

fYear

1995

fDate

16-20 May 1995

Firstpage

709

Abstract

A novel nonlinear analysis of high power amplifier instability has been developed. This analysis method deals with a loop oscillation and presents the conditions for oscillation under large-signal operation by taking account of a mixing effect of FETs. Applying this analysis method to the high power amplifier instability that an output power decreases at some compression point where an f/sub 0//2-wave is observed, it has been found that this instability is caused by an f/sub 0//2 loop oscillation. In addition, it has been verified by analysis and measurement that the oscillation can be removed by employing an isolation resistor in a closed loop circuit.<>

Keywords

circuit oscillations; circuit stability; microwave power amplifiers; nonlinear network analysis; FET mixing effect; amplifier instability; closed loop circuit; f/sub 0//2 loop oscillation; high power amplifiers; isolation resistor; large-signal operation; nonlinear analysis; FETs; High power amplifiers; Laboratories; Microwave amplifiers; Microwave communication; Power amplifiers; Power generation; Power measurement; Resistors; Solid state circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1995., IEEE MTT-S International

Conference_Location

Orlando, FL, USA

ISSN

0149-645X

Print_ISBN

0-7803-2581-8

Type

conf

DOI

10.1109/MWSYM.1995.406009

Filename

406009