• DocumentCode
    3207408
  • Title

    Measurement of the Secondary Emission Yield of a Thin Diamond Window in Transmission Mode

  • Author

    Chang, Xiangyun ; Ben-Zvi, Ilan ; Burrill, Andrew ; Hulbert, Steven ; Johnson, Peter ; Kewisch, Jorg ; Rao, Triveni ; Smedley, John ; Segalov, Zvi ; Zhao, Yongxiang

  • Author_Institution
    BNL, Upton, NY 11973 U.S.A.
  • fYear
    2005
  • fDate
    16-20 May 2005
  • Firstpage
    2251
  • Lastpage
    2253
  • Abstract
    The secondary emission enhanced photoinjector (SEEP) is a promising new approach to the generation of high-current, high-brightness electron beams. A low current primary electron beam with energy of a few thousand electron-volts strikes a specially prepared diamond window which emits secondary electrons with a current two orders of magnitude higher. The secondary electrons are created at the back side of the diamond and drift through the window under the influence of a strong electrical field. A hydrogen termination at the exit surface of the window creates a negative electron affinity (NEA) which allows the electrons to leave the diamond. An experiment was performed to measure the secondary electron yield and other properties. The results are discussed in this paper..
  • Keywords
    Acceleration; Aluminum; Cathodes; Charge carrier processes; Electron beams; Electron emission; Electron traps; Hydrogen; Linear particle accelerator; Surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
  • Print_ISBN
    0-7803-8859-3
  • Type

    conf

  • DOI
    10.1109/PAC.2005.1591073
  • Filename
    1591073