DocumentCode
3207408
Title
Measurement of the Secondary Emission Yield of a Thin Diamond Window in Transmission Mode
Author
Chang, Xiangyun ; Ben-Zvi, Ilan ; Burrill, Andrew ; Hulbert, Steven ; Johnson, Peter ; Kewisch, Jorg ; Rao, Triveni ; Smedley, John ; Segalov, Zvi ; Zhao, Yongxiang
Author_Institution
BNL, Upton, NY 11973 U.S.A.
fYear
2005
fDate
16-20 May 2005
Firstpage
2251
Lastpage
2253
Abstract
The secondary emission enhanced photoinjector (SEEP) is a promising new approach to the generation of high-current, high-brightness electron beams. A low current primary electron beam with energy of a few thousand electron-volts strikes a specially prepared diamond window which emits secondary electrons with a current two orders of magnitude higher. The secondary electrons are created at the back side of the diamond and drift through the window under the influence of a strong electrical field. A hydrogen termination at the exit surface of the window creates a negative electron affinity (NEA) which allows the electrons to leave the diamond. An experiment was performed to measure the secondary electron yield and other properties. The results are discussed in this paper..
Keywords
Acceleration; Aluminum; Cathodes; Charge carrier processes; Electron beams; Electron emission; Electron traps; Hydrogen; Linear particle accelerator; Surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
Print_ISBN
0-7803-8859-3
Type
conf
DOI
10.1109/PAC.2005.1591073
Filename
1591073
Link To Document