DocumentCode :
3207408
Title :
Measurement of the Secondary Emission Yield of a Thin Diamond Window in Transmission Mode
Author :
Chang, Xiangyun ; Ben-Zvi, Ilan ; Burrill, Andrew ; Hulbert, Steven ; Johnson, Peter ; Kewisch, Jorg ; Rao, Triveni ; Smedley, John ; Segalov, Zvi ; Zhao, Yongxiang
Author_Institution :
BNL, Upton, NY 11973 U.S.A.
fYear :
2005
fDate :
16-20 May 2005
Firstpage :
2251
Lastpage :
2253
Abstract :
The secondary emission enhanced photoinjector (SEEP) is a promising new approach to the generation of high-current, high-brightness electron beams. A low current primary electron beam with energy of a few thousand electron-volts strikes a specially prepared diamond window which emits secondary electrons with a current two orders of magnitude higher. The secondary electrons are created at the back side of the diamond and drift through the window under the influence of a strong electrical field. A hydrogen termination at the exit surface of the window creates a negative electron affinity (NEA) which allows the electrons to leave the diamond. An experiment was performed to measure the secondary electron yield and other properties. The results are discussed in this paper..
Keywords :
Acceleration; Aluminum; Cathodes; Charge carrier processes; Electron beams; Electron emission; Electron traps; Hydrogen; Linear particle accelerator; Surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
Print_ISBN :
0-7803-8859-3
Type :
conf
DOI :
10.1109/PAC.2005.1591073
Filename :
1591073
Link To Document :
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