DocumentCode :
3207536
Title :
Results of the PEP´93 intercomparison of reference cell calibrations and newer technology performance measurements
Author :
Osterwald, C.R. ; Anevsky, S. ; Barua, A.K. ; Dubard, J. ; Emery, K. ; King, D. ; Metzdorf, J. ; Nagamine, F. ; Shimokawa, R. ; Udayakumar, N. ; Wang, Y.X. ; Wittchen, T. ; Zaaiman, W. ; Zastrow, A. ; Zhang, J.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
1996
fDate :
13-17 May 1996
Firstpage :
1263
Lastpage :
1266
Abstract :
This paper presents the results of an international intercomparison of photovoltaic (PV) performance measurements and calibrations. The intercomparison, which was organized and operated by a group of experts representing national laboratories from across the globe (i.e., the authors of this paper), was accomplished by circulating two sample sets. One set consisted of twenty silicon reference cells that would, hopefully, form the basis of an international PV reference scale. A qualification procedure applied to the calibration results gave average calibration numbers with an overall standard deviation of less than 2% for the entire set. The second set was assembled from a wide range of newer technologies that present unique problems for PV measurements. As might be expected, these results showed much larger differences among laboratories. Methods were then identified that should be used to measure such devices, along with problems to avoid
Keywords :
calibration; elemental semiconductors; silicon; solar cells; PV reference scale; Si; Si solar cells; international intercomparison; photovoltaic measurements calibrations; photovoltaic performance measurements; qualification procedure; reference cell calibrations; Calibration; Energy measurement; Laboratories; Metrology; Photovoltaic systems; Quality assurance; Renewable energy resources; Solar power generation; Standardization; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
ISSN :
0160-8371
Print_ISBN :
0-7803-3166-4
Type :
conf
DOI :
10.1109/PVSC.1996.564362
Filename :
564362
Link To Document :
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