Non-intrusive built-in self-test for FPGA and MCM applications

Author

Russ, Andrew D. ; Stroud, Charles E.

Author_Institution

Lexmark Int. Inc., Lexington, KY, USA

fYear

1995

fDate

8-10 Aug. 1995

Firstpage

480

Lastpage

485

Abstract

Built-In Self-Test (BIST) techniques which are non-intrusive to the circuitry under test are investigated for incorporation in Field Programmable Gate Arrays (FPGAs) and Multi-Chip Modules (MCMs). The purpose is to test and diagnose circuitry external to the FPGAs or the various VLSI devices on MCMs during off-line system level testing. These approaches incur no area or performance penalties yet diagnostic resolution can be obtained to the device level. Design guidelines are developed to assist in the effective application and implementation of these techniques.

Keywords

VLSI; application specific integrated circuits; automatic test equipment; automatic testing; built-in self test; circuit analysis computing; fault diagnosis; field programmable gate arrays; integrated circuit testing; logic testing; multichip modules; shift registers; ATPG; FPGA; MCM; VLSI devices; circuit simulation; circuitry under test; design guidelines; diagnostic resolution; linear feedback shift register; multiple input signature register; nonintrusive built-in self-test; off-line system level testing; output response analysis; sequence controller; Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Electronic mail; Field programmable gate arrays; Frequency; Integrated circuit testing; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record

Conference_Location

Atlanta, GA, USA

Print_ISBN

0-7803-2621-0

Type

conf

DOI

10.1109/AUTEST.1995.522713

Filename

522713