DocumentCode :
3207920
Title :
Specification-based testing with linear temporal logic
Author :
Tan, Li ; Sokolsky, Oleg ; Lee, Lnsup
Author_Institution :
Dept. of Comput. & Inf. Sci., Pennsylvania Univ., Philadelphia, PA, USA
fYear :
2004
fDate :
8-10 Nov. 2004
Firstpage :
493
Lastpage :
498
Abstract :
This paper considers the specification-based testing in which the requirement is given in the linear temporal logic (LTL). The required LTL property must hold on all the executions of the system, which are often infinite in size and/or in length. The central piece of our framework is a property-coverage metric. Based on requirement mutation, the metric measures how well a property has been tested by a test suite. We define a coverage criterion based on the metric that selects a finite set of tests from all the possible executions of the system. We also discuss the technique of generating a test suite for specification testing by using the counterexample mechanism of a model checker. By exploiting the special structure of a generated test, we are able to reduce a test with infinite length to an equivalent one of finite length. Our framework provides a model-checking-assisted approach that generates a test suite that is finite in size and in length for testing linear temporal properties on an implementation.
Keywords :
formal specification; formal verification; software metrics; temporal logic; linear temporal logic; model-checking-assisted approach; property-coverage metric; requirement mutation; specification testing; specification-based testing; Formal specifications; Genetic mutations; Hardware; Information science; Logic testing; Programming; Software engineering; Software systems; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Reuse and Integration, 2004. IRI 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8819-4
Type :
conf
DOI :
10.1109/IRI.2004.1431509
Filename :
1431509
Link To Document :
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