Title :
Built-in self-test with an alternating output
Author :
Bogue, T. ; Gössel, M. ; Jürgensen, H. ; Zorian, Y.
Author_Institution :
Dept. of Comput. Sci., Waterloo Univ., Ont., Canada
Abstract :
In this paper, a new compaction technique based on signature analysis is presented. Rather than comparing the final signature with the expected one after the test is completed, the binary output of the MISA is converted into an alternating binary signal by two simple cover circuits. An error is indicated whenever the alternation of the output signal is disturbed. This technique results in a higher fault coverage, improved fault diagnosis capability, a greater test autonomy in core-based designs, and early fault notification
Keywords :
application specific integrated circuits; built-in self test; fault diagnosis; logic testing; multivalued logic; MISA; alternating output; binary output; binary signal; built-in self-test; compaction technique; core-based designs; fault coverage; fault diagnosis; fault notification; multi-input signature analysis; output signal; test autonomy; Automatic testing; Binary sequences; Built-in self-test; Circuit faults; Circuit testing; Compaction; Computer science; Fault diagnosis; Logic; Monitoring;
Conference_Titel :
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-8359-7
DOI :
10.1109/DATE.1998.655854
