Title :
Design-manufacturing interface. II. Applications [VLSI]
Author :
Maly, W. ; Heineken, H.T. ; Khare, J. ; Nag, P.K. ; Simon, P. ; Ouyang, C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
For pt. I see ibid., p. 550-6 (1998). This paper illustrates via examples problems at the design-manufacturing interface that exist in the IC industry today, and the ability of the YAN/PODEMA framework in solving these problems. The need for further development of the framework is also emphasized
Keywords :
VLSI; design for manufacture; integrated circuit design; integrated circuit manufacture; integrated circuit yield; IC industry; VLSI design; YAN/PODEMA framework; design-manufacturing interface; Design automation; Design methodology; Fabrication; Logistics; Manufacturing industries; Product design; Proposals; Software tools; Very large scale integration; Virtual manufacturing;
Conference_Titel :
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-8359-7
DOI :
10.1109/DATE.1998.655913
