Title :
An ELD tracking compensation technique for active-RC CT ΣΔ modulators
Author :
Cai, Chen-Yan ; Jiang, Yang ; Sin, Sai-Weng ; Seng-Pan, U. ; Martins, Rui P.
Author_Institution :
State Key Lab. of Analog & Mixed-Signal VLSI, Univ. of Macau, Macao, China
Abstract :
Excess Loop Delay (ELD) induced feedback DAC nonideality is a dominant factor causing error in the transfer function of CT ΣΔ modulators and eventually leading to instability. This paper will present a novel technique which aims to track the amount of excess loop delay, and compensate by using digital logic elements and an RC feedback network. A 2nd order CT ΣΔ modulator with 1-bit DAC was built at transistor-level in 65nm CMOS to demonstrate the efficiency of the method. The Cadence simulation results show that, by using the proposed technique, the modulator can track the ELD up to 50% of the clock period duration and compensate it, leading to 69.2dB SNDR when compared with the ideal value of 70dB SNDR.
Keywords :
modulators; transfer functions; CMOS; ELD tracking compensation technique; RC feedback network; SNDR; active RC CT; cadence simulation; clock period duration; digital logic element; dominant factor; excess loop delay induced feedback DAC nonideality; sigma delta modulators; transfer function; transistor level; Capacitors; Clocks; Delay; MOS devices; Modulation; Optical signal processing; Tin;
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2012.6292215