DocumentCode :
3208352
Title :
Integrated diagnostic and repair information system (IDRIS)-an open system approach
Author :
Bosco, Charles D. ; Su, Li Pi ; Darty, MarkA ; Kusek, Stephen M. ; Griffin, Brenda A. ; Lee, Thomas C.
Author_Institution :
U.S. Army TMDE Activity, Redstone Arsenal, AL, USA
fYear :
1995
fDate :
8-10 Aug. 1995
Firstpage :
496
Lastpage :
502
Abstract :
The IDRIS successfully established the proof-of-concept that easy-to-use software can be developed to integrate advanced test, diagnostics, communication, and maintenance software packages by creating an intuitive user interface to manage the complex software interfaces. Tests of IDRIS demonstrated that automating more of the complete maintenance procedure is possible and that can directly correlate to a decrease in the system´s mean time to repair (MTTR). A lower MTTR is one step toward simultaneously increasing the operational readiness and decreasing the life-cycle cost.
Keywords :
automatic test equipment; automatic test software; command and control systems; computer communications software; fault diagnosis; integrated software; maintenance engineering; military computing; military equipment; military standards; open systems; software management; software packages; software tools; user interface management systems; BIT status; Howitzer automatic fire control system; IDRIS; MIL-STD-1553B simulator; Paladin tank; advanced software automation; advanced test software; communication software; complex software interfaces; diagnostics software; easy-to-use software; integrated diagnostic and repair information system; intuitive user interface; life-cycle cost; logistic needs; maintenance software packages; mean time to repair; open system approach; operational readiness; single interface environment; Automatic testing; Costs; Information systems; Management information systems; Software development management; Software maintenance; Software packages; Software testing; System testing; User interfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
Type :
conf
DOI :
10.1109/AUTEST.1995.522716
Filename :
522716
Link To Document :
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