• DocumentCode
    3208601
  • Title

    Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs

  • Author

    Parkey, Charna R. ; Mikhael, Wasfy B. ; Chester, David B.

  • Author_Institution
    Dept. of EECS, Univ. of Central Florida, Orlando, FL, USA
  • fYear
    2012
  • fDate
    5-8 Aug. 2012
  • Firstpage
    1152
  • Lastpage
    1155
  • Abstract
    The problem of characterizing transfer functions of Analog to Digital Converters (ADC) for use in compensation of Time Interleaved Analog to Digital Converters (TIADC) is ubiquitous in the area of mismatch correction algorithms. Identifying, classifying, and quantifying the presence of errors in ADCs and TIADCs is fundamental in the pursuit of correcting these errors. This problem, characterization of error effects, is investigated through calculation of higher order cumulants on the error signals of each type of system. The concept of cumulant calculation and interpretation is presented and applied to varying error environments and input signals.
  • Keywords
    analogue-digital conversion; compensation; error correction; interleaved codes; pattern classification; transfer functions; ADC error sources; TIADC compensation; cumulant characterizations; error correction; error effects; error environments; higher order cumulants; time interleaved ADC; time interleaved analog-to-digital converters compensation; transfer functions; Analog-digital conversion; Apertures; Gaussian noise; Higher order statistics; Jitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
  • Conference_Location
    Boise, ID
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4673-2526-4
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2012.6292229
  • Filename
    6292229