Title :
Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs
Author :
Parkey, Charna R. ; Mikhael, Wasfy B. ; Chester, David B.
Author_Institution :
Dept. of EECS, Univ. of Central Florida, Orlando, FL, USA
Abstract :
The problem of characterizing transfer functions of Analog to Digital Converters (ADC) for use in compensation of Time Interleaved Analog to Digital Converters (TIADC) is ubiquitous in the area of mismatch correction algorithms. Identifying, classifying, and quantifying the presence of errors in ADCs and TIADCs is fundamental in the pursuit of correcting these errors. This problem, characterization of error effects, is investigated through calculation of higher order cumulants on the error signals of each type of system. The concept of cumulant calculation and interpretation is presented and applied to varying error environments and input signals.
Keywords :
analogue-digital conversion; compensation; error correction; interleaved codes; pattern classification; transfer functions; ADC error sources; TIADC compensation; cumulant characterizations; error correction; error effects; error environments; higher order cumulants; time interleaved ADC; time interleaved analog-to-digital converters compensation; transfer functions; Analog-digital conversion; Apertures; Gaussian noise; Higher order statistics; Jitter;
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2012.6292229