Combined XPS/UPS/FES for characterisation of electron emission mechanism from diamond

Author

Yamaguchi, H. ; Kudo, Y. ; Masuzawa, T. ; Kudo, M. ; Yamada, T. ; Takakuwa, Y. ; Okano, K.

Author_Institution

Int. Christian Univ., Tokyo

fYear

2007

fDate

8-12 July 2007

Firstpage

18

Lastpage

19

Abstract

In this study, natural type lib diamond was used to characterise the origin of emitting electrons by the means of combined XPS/UPS/FES. Natural type lib diamond is one of the most intensively studied diamond due to its semiconductor properties and negative electron affinity (NEA) on hydrogenated (111) surface. The origin of emitting electrons from hydrogenated natural type lib diamond (111) surface, thus, can be a one of the most appropriate reference data for the future studies for diamond with various dopants and various surface terminations.

Keywords

X-ray photoelectron spectra; diamond; electron affinity; electron emission; elemental semiconductors; ultraviolet photoelectron spectra; C; combined XPS-UPS-FES characterisation; electron emission mechanism; field emission spectroscopy; hydrogenated surface; natural type IIb diamond; negative electron affinity; semiconductor properties; surface terminations; ultraviolet photoemission spectroscopy; x-ray photoemission spectroscopy; Electron emission; Gold; Helium; Materials science and technology; Photoelectricity; Physics; Spectroscopy; Surface contamination; Uninterruptible power systems; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International

Conference_Location

Chicago, IL

Print_ISBN

978-1-4244-1133-7

Electronic_ISBN

978-1-4244-1134-4

Type

conf

DOI

10.1109/IVNC.2007.4480914

Filename

4480914